Results for “gmd_event_spec_disp”

AI-generated from documented ETRM metadata — verify critical details on the linked pages.

Overview

GMD_EVENT_SPEC_DISP is a Process Manufacturing Product Development (GMD) table that stores the OPM Quality Event Specification Display records. It acts as the bridge between a quality sampling event and the specification (and specification version) that governs that event, holding the resulting disposition and related indicator flags. In Oracle EBS 12.1.1 and 12.2.2, this object supports quality data collection, lot attribute determination, and UOM conversion traceability for process-manufactured items.

The ETRM metadata classifies this object heuristically as standalone under the Data Vault model, meaning it does not behave as a pure hub, link, or satellite. As a modeling suggestion, this reflects that the table carries its own surrogate key and a single outward foreign key, functioning more as an independent reference/association entity than as part of a broader hub-and-link network.

Key Information Stored

The table is documented with 12 columns. The most significant are:

• EVENT_SPEC_DISP_ID — Surrogate primary key (GMD_EVENT_SPEC_DISP_PK). This is the unique identifier and the only documented unique-index business-key candidate.
• SAMPLING_EVENT_ID — Foreign key linking to GMD_SAMPLING_EVENTS; identifies the sampling event to which the specification display applies.
• SPEC_ID — The specification associated with the event.
• SPEC_VR_ID — The specification version, differentiating revisions of the same specification.
• DISPOSITION — The quality disposition outcome recorded against the event/specification combination.
• SPEC_USED_FOR_LOT_ATTRIB_IND — Indicator (Y/N) denoting whether the specification was used to determine lot attributes.
• DELETE_MARK — Soft-delete flag for logical record removal.
• CREATION_DATE, CREATED_BY — Audit columns capturing row creation.
• LAST_UPDATE_DATE, LAST_UPDATED_BY, LAST_UPDATE_LOGIN — Standard audit columns capturing the most recent modification.

The surrogate key (EVENT_SPEC_DISP_ID) is distinct from any business key; the metadata documents no alternate unique index beyond the primary key.

Common Use Cases and Queries

Typical scenarios include retrieving the specification and disposition for a given sampling event, and tracing which lots had attributes derived from a specification.

• Joining to GMD_SAMPLING_EVENTS to resolve event details:
  SELECT d.EVENT_SPEC_DISP_ID, d.SPEC_ID, d.SPEC_VR_ID, d.DISPOSITION FROM GMD.GMD_EVENT_SPEC_DISP d, GMD.GMD_SAMPLING_EVENTS e WHERE d.SAMPLING_EVENT_ID = e.SAMPLING_EVENT_ID;
• Reporting dispositions by specification version, filtering on DELETE_MARK = 0.
• Identifying events where SPEC_USED_FOR_LOT_ATTRIB_IND = 'Y' for lot attribute auditing.
• Tracing UOM conversion and audit records that reference a specific EVENT_SPEC_DISP_ID back to the originating quality event.

Related Objects

The following objects are directly tied to this table through documented key relationships:

• GMD_SAMPLING_EVENTS — Referenced by GMD_EVENT_SPEC_DISP.SAMPLING_EVENT_ID; the parent sampling event.
• MTL_LOT_UOM_CLASS_CONVERSIONS — References this table via EVENT_SPEC_DISP_ID.
• GMI_ITEM_CONV_AUDIT — References this table via EVENT_SPEC_DISP_ID.
• MTL_LOT_CONV_AUDIT — References this table via EVENT_SPEC_DISP_ID.
• IC_ITEM_CNV — References this table via EVENT_SPEC_DISP_ID.
• GMD_MASS_RESULTS_GT — References this table via EVENT_SPEC_DISP_ID, supporting mass/quality result processing.

These relationships position GMD_EVENT_SPEC_DISP as a central reference for quality-driven UOM conversion and lot attribute derivation across process manufacturing.